Precision Reflected Light Microscope for Material Analysis

The SLV-21M operates as a high-precision reflected light microscope (also known as an incident light microscope)It utilizes a Quadruple Backward Nosepiece equipped with superior LWD (Long Working Distance) Infinity Plan objectives. These optics are essential for metal sample examination where surface topography varies, preventing damage to the lens during surface inspection.

Standard objectives include 5x, 10x, and 50x, with optional 20x, 80x, and 100x lenses available. This range is critical for detailed grain structure microscope applications and metal microstructure analysis.

Advanced Illumination & Mechanics

This system features a powerful Reflect Light Source 5W LED Warm Lamp with a five-hole filter disc (Blue, Green, Amber, Grey, Empty) to enhance contrast. It supports Brightfield/Darkfield (BF/DF) observation capabilities, making it a versatile brightfield darkfield microscope suitable for complex material analysis.

The large precision mechanical stage microscope platform (200 × 140 mm) offers a travel range of 76 × 52 mm], accommodating heavy industrial samples for wear analysis and fractography.

Industrial Applications

The SLV-21M is the industry standard for industrial inspection. Its robust design supports:

• Semiconductor Inspection Microscope: For examining wafers and circuitry.
• Coating Analysis Microscope: For measuring thin film and plating thickness.
• Heat Treatment Analysis Microscope: For verifying phase transformation in metals.
• Fractography Microscope: For failure analysis of broken components.

Frequently Asked Questions

1. What makes this an "Upright Metallurgical Microscope"?

An upright metallurgical microscope like the SLV-21M positions the objectives above the sample. Unlike biological scopes, it uses an incident light microscopy path to illuminate opaque samples like metals and alloys.

2. Does it support Polarized Light Microscopy?

Yes. The SLV-21M includes a built-in Analyzer and Polarizer, enabling polarized light microscopy. This is essential for identifying non-metallic inclusions and anisotropic grain structures in industrial materials testing.

3. Can I use this for on-site pipeline inspection?

Absolutely. The unit features a 5V 1A output that supports Power Bank Supply, allowing it to function as a portable industrial inspection microscope in the field without mains electricity.

4. Is it suitable for Quality Control (QC)?

Yes. With its high-resolution LWD infinity plan objectives and digital camera compatibility, it serves as an excellent quality control inspection microscope for documentation and reporting.

5. Can I attach a camera for digital analysis?

Yes. The trinocular head includes a dedicated port. We offer C-Mount adapters (0.5x, 0.75x, 1.0x) to attach cameras, turning this into a powerful digital material analysis microscope.

6. What focus precision does it offer?

The system features Coaxial Coarse and Fine Focusing with a scale precision of 2 µm, ensuring ultra-sharp images during metal sample examination.

7. Does it support Darkfield microscopy?

The unit is designated as a BF/DF (Brightfield/Darkfield) capable system, allowing for enhanced edge detection on highly reflective surfaces typical in semiconductor inspection.

8. What is the stage size?

It features a robust double-layer mechanical stage sized 200 × 140 mm, providing ample room for large samples used in coating analysis.