The SCOUT 350 AFM Probe is a high-performance atomic force microscopy (AFM) probe, engineered for tapping mode AFM, contact mode AFM, and advanced scanning probe microscopy (SPM) techniques. Designed for high-resolution AFM imaging, this probe provides exceptional accuracy in surface characterization, nanomaterials analysis, and force spectroscopy measurements.
Manufactured with high-quality silicon cantilevers, the SCOUT 350 AFM probe is optimized for multiple AFM applications, including magnetic force microscopy (MFM) and conductive AFM. Its precise tip geometry and optimized mechanical properties make it an ideal choice for surface topography measurements and nanotechnology research.
The SCOUT 350 AFM probe is a trusted tool for AFM techniques used in materials science, semiconductor analysis, and biological research, delivering consistent and repeatable results.
Superior Imaging & High-Resolution Performance
- Optimized for Non-Contact & Soft Tapping AFM – Ensures minimal tip-sample interaction for sensitive sample analysis.
- High Aspect Ratio Tip (HAR) – Less than 15° cone angle over the final 1 μm, ideal for deep trench imaging and high-precision scanning.
- Advanced Tip Design – Features a nominal tip radius of 5 nm, ensuring sharp, detailed imaging at the nanoscale level.
- Optimized Spring Constant & Resonant Frequency – Provides high stability and accuracy across different AFM applications.
Versatile Coating Options for Enhanced Performance
- Uncoated Version – Ideal for general-purpose AFM applications where additional reflectivity is not required.
- Aluminum-Coated (Al) – Enhances laser reflection efficiency, improving AFM probe signal quality.
- Gold-Coated (Au) – Best for conductive AFM measurements and enhanced optical detection.
Consistent & Reliable AFM Performance
- Manufactured with Tight Dimensional Tolerances – Minimizes variations in spring constant and resonance frequency, ensuring consistent results across all AFM scans.
- Designed for AC Mode AFM & Force Modulation AFM – Suitable for quantitative nanomechanical property measurements.
- Compatible with Leading AFM Systems – Works seamlessly with a wide range of AFM instruments from top AFM probe suppliers.
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| Parameter | Specification |
|---|---|
| Spring Constant | 40 N/m |
| Resonant Frequency | 350 kHz |
| Tip Radius | Nominal 5 nm |
| Tip Height | Approx. 12 μm |
| Cantilever Length | 125 μm |
| Cantilever Width | 30 μm |
| Cantilever Thickness | 2.5 μm |
| Coating Options | Uncoated, Aluminum, Gold, Conductive Coating |
| Mode of Operation | Contact Mode, Tapping Mode, Magnetic Force Microscopy (MFM), Conductive AFM |
| Application Areas | Surface Topography Measurement, Nanomaterials Characterization, Semiconductor Research, AFM Imaging Techniques |
The SCOUT 350 AFM Probe is designed for high-resolution AFM imaging across multiple scientific disciplines, including:
🔹 Nanomaterials Characterization with AFM – Analyze thin films, polymers, and advanced nanomaterials.
🔹 Semiconductor Research – Measure surface roughness, defects, and topography in semiconductor devices.
🔹 Biological AFM Imaging – Ideal for AFM imaging techniques in biological samples and cell research.
🔹 Force Spectroscopy with AFM – Conduct detailed force measurements for nanoscale interactions.
- High-Performance Probe for Atomic Force Microscopy (AFM): Designed for high-resolution AFM imaging, ensuring precise force measurement and surface characterization.
- Versatile Applications in Nanotechnology: Ideal for surface topography measurement, force spectroscopy with AFM, and nanomaterials characterization.
- Compatible with a Wide Range of AFM Techniques: Perfect for contact mode AFM, tapping mode AFM, conductive AFM, and magnetic force microscopy (MFM).
- Multiple Coating Options for Specific Research Needs: Available in uncoated, aluminum-coated (for enhanced reflectivity), gold-coated (for conductive AFM), and other specialized versions.
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