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SPARK 70 Pt Conductive AFM Probe | Ultra-Soft Pt-Coated Electrical
Ultra-Soft Conductive Probes
Category: NuNano AFM Probes

NuNano SPARK 70 Pt Conductive AFM Probe | Ultra-Soft Electrical

The NuNano SPARK 70 Pt is a revolutionary ultra soft conductive afm probe designed for the most delicate electrical characterizations. Functioning perfectly in contact mode, non contact pt coated delicate scans, and soft tapping conductive modes, it is the premier pt coated afm probe very soft solution for preventing sample degradation while mapping complex electrical properties.

Built upon the flexible SCOUT 70 cantilever, it features a spark 70 pt 2 n/m spring constant and a 70 kHz resonant frequency. This silicon n type antimony probe utilizes an optimized spark 70 pt 40 nm pt 5 nm ti coating applied to both the frontside tip and backside. It acts as the ultimate low force c-afm probe for mapping skpm soft polymers and biological samples.

Dual Platinum Coated (Pt + Ti)
SEM Imaged Tips

Pack of 10 Probes    2 N/m Spring Constant    < 30 nm Tip Radius

40nm Pt + 5nm Ti
Dual Coating
Ultra-Soft
2 N/m Spring Constant
70 kHz
Frequency
SEM Imaged
Tips Included
Low Force
Conductive

Technical Specifications: NuNano SPARK 70 Pt

The SPARK 70 Pt is meticulously engineered to establish a stable electrical contact on highly delicate substrates without inflicting mechanical damage. Every tip is verified with SEM images for absolute precision.

Cantilever Specifications
Material & Dopingsilicon n‑type antimony doped, resistivity 0.015–0.025 Ω·cm
Cantilever Shapespark 70 pt rectangular cantilever 225 µm
Spring Constantconductive afm spring constant 2 n/m (Range: 0.5 - 3.5 N/m)
Resonant Frequencyafm resonant frequency 70 kHz (Range: 45 - 80 kHz)
Lengthafm cantilever length 225 µm (Range: 223 - 227 µm)
Width30 µm (Range: 29 - 31 µm)
Thickness2.5 µm (Range: 2.0 - 3.0 µm)
Reflective Backside Coating platinum reflective 5 nm Ti + 40 nm Pt backside
Tip Specifications (Conductive)
Tip Shapeafm conical tip cone angle 25° (Range: 15° - 40°)
Frontside Tip Coatingplatinum coating 5 nm Ti + 40 nm Pt frontside/tip
Tip RadiusNominal 18 nm (Guaranteed spark 70 pt tip radius <30 nm)
Tip Heightspark 70 pt tip height 12 µm (Range: 10 - 13 µm)
Tip Setbackspark 70 pt setback 7.5 µm (Range: 6.5 - 8.5 µm)
Packaging & Quality Assurance
Quantityspark 70 pt conductive probes pack 10
Quality Controlsem images each conductive tip provided for every probe

Key Applications: Electrical Mapping on Very Soft Samples

  • Kelvin Probe Force Microscopy (SKPM) The stable platinum coating and gentle cantilever make this the premier kelvin probe biomolecules pt tool for skpm ultra soft tapping on highly delicate organic films.
  • Conductive AFM (c-AFM) & PtIR Designed as a low force c‑afm probe, it operates flawlessly as a ptir soft matter contact mode scanner and for c‑afm delicate polymers air applications.
  • Biomolecules & Soft Matter With a flexible 2 N/m cantilever, it is ideal for electrical mapping very soft samples and complex conductive afm biomolecules electrical tracking without mechanical tearing.

Frequently Asked Questions: Ultra-Soft Conductive Probes

The SPARK 70 Pt is an ultra soft conductive afm probe explicitly engineered for electrical mapping very soft samples. It excels in c-AFM delicate polymers air analysis, PtIR soft matter contact mode, and conductive afm biological imaging without damaging the substrate.
This pt coated afm probe very soft model utilizes a highly stable platinum coating 5 nm Ti + 40 nm Pt frontside/tip layer and an identical platinum reflective 5 nm Ti + 40 nm Pt backside. This ti pt afm electrical soft matter design ensures a highly reliable electrical pathway and peak laser reflection.
It operates with a highly flexible spark 70 pt 2 n/m spring constant and an afm resonant frequency 70 kHz. These mechanics make it the ultimate low force c-afm probe, perfect for conductive soft tapping electrical applications.
Even with the robust metallic layers required for electrical flow, the spark 70 pt conical tip radius is exceptionally fine at a nominal 18 nm, guaranteeing a tip radius <30 nm for precise topographical and electrical resolution.
Yes, for unparalleled quality control, every ultra low k conductive afm pack 10 includes spark 70 pt sem images individual tips. This guarantees a highly reliable probe free from manufacturing defects.
To buy spark 70 pt afm probes, submit a quote request via our contact form. We will immediately provide the exact nunano spark 70 pt price in India, including specific spark 70 pt pack 10 cost details.