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The NuNano SCOUT 70 HAR is an exceptional ultra soft har afm probe engineered for mapping the most delicate complex topographies. Optimized strictly as a har afm probe very soft samples solution, it excels in afm probe deep trench soft materials imaging. Whether executing soft tapping deep trench afm routines, non contact har afm delicate scans, or force modulation har probe air modes, this probe ensures zero sample damage while capturing high-resolution depth profiles.
Built with a gentle scout 70 har 2 n/m spring constant and a 70 kHz resonant frequency, the distinguishing feature is its extraordinary scout 70 har cone angle <15° over last 1 µm. This provides an incredibly sharp high aspect ratio afm tip conical geometry, making it the definitive low force deep trench afm tip for mapping afm topography steep soft features, biomolecules, and narrow polymer grooves.
✓ SEM Imaged Tips ✓ < 15° Cone Angle ✓ Pack of 10 Probes
The SCOUT 70 HAR is designed specifically to prevent sample tearing while mapping steep trenches on highly delicate substrates. Every tip is verified with SEM images for absolute precision.
| Cantilever Specifications | |
|---|---|
| Material & Doping | n type silicon antimony doped, resistivity 0.015–0.025 Ω·cm |
| Cantilever Shape | Rectangular har silicon cantilever soft imaging |
| Spring Constant | afm probe spring constant 2 n/m (Range: 0.5 - 3.5 N/m) |
| Resonant Frequency | afm probe resonant frequency 70 kHz (Range: 45 - 80 kHz) |
| Length | afm cantilever length 225 µm (Range: 223 - 227 µm) |
| Width | 30 µm (Range: 29 - 31 µm) |
| Thickness | 2.5 µm (Range: 2.0 - 3.0 µm) |
| Reflective Backside Coatings |
Uncoated: No additional coating Aluminium (RAL): aluminium reflective 40 nm Al backside Gold (RAU): gold reflective 5 nm Ti + 40 nm Au backside |
| Tip Specifications (High Aspect Ratio) | |
| Tip Shape | high aspect ratio afm tip conical |
| Tip Radius | Nominal 5 nm (Guaranteed scout 70 har tip radius <10 nm) |
| Tip Height | 12 µm (Range: 10 - 13 µm) |
| Tip Setback | scout 70 har setback 7.5 µm (Range: 6.5 - 8.5 µm) |
| Cone Angle (Last 1 µm) | afm tip last 1 µm narrow cone (< 15°) |
| Packaging & Quality Assurance | |
| Quantity | scout 70 har afm probes pack of 10 |
| Quality Control | SEM images each tip reliable low dud rate provided for every probe |
To provide flawless integration with various scanning probe microscopes, the scout 70 har afm probe is offered with customizable backside reflective treatments.