Atomic Force Microscopy Probes
Category: NuNano AFM Probes
NuNano SCOUT 350 Silicon AFM Probe | Tapping & AC Mode Tip
The NuNano SCOUT 350 is a premium general purpose afm tip designed specifically for optimal performance as a tapping mode afm probe and an ac mode afm probe in air. Manufactured from highly consistent n type silicon afm probe antimony doped material, this atomic force microscopy probe delivers extraordinary surface topography detail for researchers and metrology labs.
Engineered with a scout 350 42 n/m spring constant and a 350 kHz resonant frequency, this model guarantees outstanding mechanical stability. The probe features a uniquely sharp afm tip <10 nm radius positioned atop a precise rectangular afm cantilever 125 µm long. It serves as the ultimate nanoscale imaging probe for analyzing rigid surfaces and delicate soft polymer samples alike.
✓ AFM probes pack of 10 ✓ Extremely Low Dud Rate ✓ < 10 nm Tip Radius
AFM Probe
350 kHz
350 kHz
AFM Probe
40 N/m
40 N/m
< 10 nm
Sharp Tip Radius
Sharp Tip Radius
N-Type
Antimony Doped
Antimony Doped
Tapping Mode
in Air
in Air
Technical Specifications: NuNano SCOUT 350
The NuNano SCOUT 350 series provides industry-leading precision. Below are the complete specifications covering both the cantilever and the tip geometry.
| Cantilever Specifications | |
|---|---|
| Material & Doping | N-type Silicon, Antimony doped afm tip |
| Resistivity | 0.015 – 0.025 Ω·cm |
| Cantilever Shape | Rectangular afm cantilever |
| Spring Constant | Nominal 42 N/m (Range: 25 - 70 N/m) |
| Resonant Frequency | Nominal 350 kHz (Range: 300 - 400 kHz) |
| Length | 125 µm |
| Width | 30 µm |
| Thickness | 4.5 µm |
| Reflective Backside Coatings |
Uncoated: No additional coating Aluminium (RAL): 40 nm Al coating Gold (RAU): 5 nm Ti / 40 nm Au coating |
| Tip Specifications | |
| Tip Shape | Conical afm tip |
| Tip Radius | Nominal 5 nm (Guaranteed highly sharp at < 10 nm radius) |
| Tip Height | 12 µm |
| Tip Setback | 7.5 µm |
| Cone Angle | Nominal 25° (Range: 15° - 40°) |
| Packaging | |
| Quantity | AFM probes pack of 10 |
Comprehensive Coating Options
To ensure total compatibility with various laser alignments and optical tracking systems across the industry, the scout 350 afm probe series provides multiple reflective backside coating choices.
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SCOUT 350 Uncoated AFM Probes The standard baseline option. These uncoated afm probes are ideal for general setups and specialized equipment where additional metallic reflectivity is unneeded.
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SCOUT 350 RAL (Aluminium Backside) Features a precision aluminium coated afm cantilever. The scout 350 ral aluminium reflective coating (40 nm Al) significantly amplifies laser reflectivity, making it excellent for high-volume tapping mode afm imaging in air.
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SCOUT 350 RAU (Gold Backside) Features an inert gold coated afm cantilever. The scout 350 rau gold reflective coating (5 nm Ti / 40 nm Au) provides peak reflective performance, ensuring a stable laser sum signal in complex optical setups.
Key Applications for the SCOUT 350 Tapping Mode AFM Tip
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Hard Surface & Semiconductor Imaging The inherently stiff 42 N/m cantilever design establishes this as the superior hard sample afm probe. It captures phenomenal detail during the afm topography imaging of semiconductors and robust metallic nanostructures.
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Stable Soft Polymers While generally stiff, expertly fine-tuning this ac mode afm tip allows it to act as an incredibly effective afm probe for stable soft polymer samples without causing unwanted destructive surface gouging.
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Nanotechnology & Materials Science Relied upon by top-tier university research labs, these afm probes for nanotechnology research are heavily utilized for capturing the high resolution afm of thin films and complex nanomaterials.
Frequently Asked Questions: NuNano AFM Probes
The SCOUT 350 is a general purpose afm tip optimized for ac mode afm probe in air, tapping mode afm probe, and non-contact imaging. It provides exceptional surface topography for thin films, semiconductors, and hard samples.
It boasts a precise rectanglular afm cantilever measuring 125 µm length, 30 µm width, and 4.5 µm thickness. The conical afm tip sports a highly sharp afm tip <10 nm radius (nominal 5 nm) and a tip height of 12 µm, ensuring pristine nanoscale tracking.
Yes, while it primarily excels as an afm probe for hard surface imaging, the SCOUT 350 operates as an excellent afm probe for stable softer samples when tuned and operated carefully in amplitude-modulation tapping mode.
These precision tools are strictly sold as an afm probes pack of 10. This convenient packaging guarantees you maintain a reliable supply with an exceptionally low dud rate for continuous workflows in materials science and university research labs.
If you are looking to buy scout 350 afm probes or need a quote for scout 350 silicon afm probes in India, simply fill out the quotation form on our page. As your dedicated afm probe supplier nunano, we will rapidly provide pricing, including the aluminium coated scout 350 ral price, the gold coated scout 350 rau price, and bulk order scout 350 afm tips costs.