High Aspect Ratio AFM Probes
Category: NuNano AFM Probes
NuNano SCOUT 350 HAR Silicon AFM Probe | Deep Trench Imaging
The NuNano SCOUT 350 HAR is a specialized high aspect ratio silicon afm probe engineered explicitly for deep trench afm imaging and resolving steep sidewalls. Designed for ac mode afm tip applications and tapping mode in air, this advanced atomic force microscopy probe delivers unrivaled topographical accuracy for narrow grooves and complex nanostructures.
Built upon the proven SCOUT 350 architecture with a 42 n/m spring constant and 350 khz resonant frequency, the HAR variant boasts an ultra-narrow afm tip cone angle <15° over the last 1 µm. This makes it the definitive high resolution afm probe for grooves, ensuring reliable performance on hard samples and stable soft polymers alike.
✓ SEM Imaged Tips ✓ < 15° Cone Angle ✓ Pack of 10 Probes
Deep Trench
Imaging
Imaging
< 15° Narrow
Cone Angle
Cone Angle
SEM Imaged
Tips Included
Tips Included
42 N/m
Spring Constant
Spring Constant
Tapping Mode
in Air
in Air
Technical Specifications: NuNano SCOUT 350 HAR
The SCOUT 350 HAR series guarantees exceptional data retrieval for demanding topographies. Every single probe in the pack comes with individual SEM images to verify the high aspect ratio afm tip quality.
| Cantilever Specifications | |
|---|---|
| Material & Doping | N type silicon afm probe, Antimony doped |
| Resistivity | 0.015 – 0.025 Ω·cm |
| Cantilever Shape | Rectangular afm cantilever |
| Spring Constant | Nominal 42 N/m (Range: 25 - 70 N/m) |
| Resonant Frequency | Nominal 350 kHz (Range: 300 - 400 kHz) |
| Length | 125 µm |
| Width | 30 µm |
| Thickness | 4.5 µm |
| Reflective Backside Coatings |
Uncoated: No additional coating Aluminium (RAL): 40 nm Al coating Gold (RAU): 5 nm Ti / 40 nm Au coating |
| Tip Specifications (High Aspect Ratio) | |
| Tip Shape | High aspect ratio conical tip |
| Tip Radius | Nominal 5 nm (Guaranteed < 10 nm sharp afm tip) |
| Tip Height | 12 µm |
| Tip Setback | 7.5 µm |
| Cone Angle (Last 1 µm) | < 15° cone angle over final 1 µm |
| Packaging & Quality Assurance | |
| Quantity | AFM probes pack of 10 |
| Quality Control | AFM probe SEM images provided for each tip |
Comprehensive Coating Options
To maintain broad compatibility across all laser tracking systems, the scout 350 har afm probe is offered with multiple reflective backside treatments.
-
SCOUT 350 HAR Uncoated The standard scout 350 har uncoated afm probe is perfect for systems that do not require specialized metallic reflectivity.
-
SCOUT 350 HAR RAL (Aluminium Backside) Equipped with a scout 350 har aluminium backside 40 nm al coating, this variant greatly enhances laser bounce for standard tapping mode deep trench afm air.
-
SCOUT 350 HAR RAU (Gold Backside) Utilizes a scout 350 har gold backside 5 nm ti 40 nm au coating to deliver maximum reflective intensity, critical for sophisticated optical setups.
Key Applications for the SCOUT 350 HAR
-
Deep Trench & Semiconductor Imaging Specifically crafted as an afm probe for narrow features, it flawlessly resolves afm topography steep features and semiconductor trenches without tip artifact interference.
-
Nanofabrication & Hard Materials Its sturdy 42 n/m spring constant ensures it performs perfectly as a har afm probe for hard samples, ideal for analyzing deep etching and nano fabrication processes.
-
Stable Soft Polymers When operated carefully in AC mode, this high aspect ratio afm for polymers can safely map deep grooves and stable soft samples trenches.
Frequently Asked Questions: High Aspect Ratio Probes
A high aspect ratio afm probe like the SCOUT 350 HAR is explicitly designed for afm probe deep trench imaging and analyzing steep sidewalls. Its narrow profile allows it to penetrate deep into narrow features and grooves where standard conical tips cannot reach.
The primary difference lies in the tip geometry. The scout 350 har afm tip features an incredibly narrow afm tip cone angle <15° over the last 1 µm of the tip, making it a specialized high aspect ratio conical tip. Furthermore, each scout 350 har pack includes SEM imaged tips for guaranteed quality.
It is available in three configurations: scout 350 har uncoated afm probe, scout 350 har ral aluminium reflective coating (40 nm Al), and scout 350 har rau gold reflective coating (5 nm Ti / 40 nm Au) to match your specific laser tracking system.
The har silicon afm cantilever measures 125 µm in length, 30 µm in width, and 4.5 µm in thickness. It delivers an afm probe spring constant 42 n/m and an afm probe resonant frequency 350 khz, making it ideal for tapping mode deep trench afm air.
Yes, while it is fundamentally an exceptional har afm probe for hard samples and semiconductor trenches, careful operation in AC/tapping mode makes it a highly effective afm probe for stable soft samples trenches and complex polymers.
You can buy scout 350 har afm probes directly through our portal. These are sold as a scout 350 har afm probes pack of 10. Submit a quotation request to receive the exact nunano scout 350 har price in India, including bulk scout 350 har afm tips pricing.