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The NuNano SCOUT 150 HAR is a highly specialized high aspect ratio afm probe 150 khz engineered exclusively for complex topographies. Optimized as a har afm probe softer samples model, it excels in afm probe deep trench soft materials imaging. Whether utilizing ac mode afm tip dynamics, tapping mode, or force modulation afm grooves, this probe ensures zero sample damage while capturing ultra-fine depth details.
Built upon the proven 150 platform, it features a gentle scout 150 har 18 n/m spring constant. The distinguishing feature is its extraordinary scout 150 har cone angle <15° over last 1 µm, providing an incredibly sharp high aspect ratio afm tip conical profile. This guarantees pristine imaging of steep sidewalls soft polymers and thin films trenches.
✓ SEM Imaged Tips ✓ < 15° Cone Angle ✓ Pack of 10 Probes
The SCOUT 150 HAR is fabricated to guarantee exceptional topographical mapping of steep trenches on soft substrates. Every tip is verified with SEM images for strict quality assurance.
| Cantilever Specifications | |
|---|---|
| Material & Doping | N type silicon antimony doped, resistivity 0.015–0.025 Ω·cm |
| Cantilever Shape | Rectangular har silicon afm cantilever 225 µm |
| Spring Constant | afm probe spring constant 18 n/m (Range: 5 - 25 N/m) |
| Resonant Frequency | afm probe resonant frequency 150 khz (Range: 120 - 170 kHz) |
| Length | 225 µm (Range: 223 - 227 µm) |
| Width | 30 µm |
| Thickness | 5.5 µm |
| Reflective Backside Coatings |
Uncoated: No additional coating Aluminium (RAL): aluminium reflective 40 nm al backside Gold (RAU): gold reflective 5 nm ti 40 nm au backside |
| Tip Specifications (High Aspect Ratio) | |
| Tip Shape | high aspect ratio afm tip conical |
| Tip Radius | Nominal 5 nm (Guaranteed scout 150 har tip radius <10 nm) |
| Tip Height | 12 µm (Range: 10 - 13 µm) |
| Tip Setback | 7.5 µm (Range: 6.5 - 8.5 µm) |
| Cone Angle (Last 1 µm) | < 15° cone angle over final 1 µm |
| Packaging & Quality Assurance | |
| Quantity | scout 150 har afm probes pack of 10 |
| Quality Control | sem imaged afm tips low dud rate provided for each tip |
To provide flawless integration with various scanning probe microscopes, the scout 150 har afm probe is offered with customizable backside reflective treatments.