The SPARK 70 Conductive AFM Probe is a high-performance Atomic Force Microscopy (AFM) tip, designed for nanomechanical characterization and electrical property mapping. Featuring a platinum-coated AFM tip, it provides low-noise, high-resolution scanning for applications such as conductive AFM for semiconductors, materials research, and nanoelectrical measurements.
With its robust mechanical stability and excellent conductivity, the SPARK 70 probe is widely used in Scanning Probe Microscopy (SPM), nanotechnology surface analysis, and semiconductor device testing.
- Platinum-Coated AFM Tip for Superior Conductivity – Enables precise electrical characterization with low-contact resistance.
- High-Resolution AFM Imaging for Nanoscale Analysis – Ensures accurate conductivity mapping and electrical property measurements.
- Optimized for Conductive AFM (C-AFM) & Electrical Characterization – Delivers stable, high-quality results in semiconductor research and nanotechnology.
- Low-Noise AFM Probe for Enhanced Sensitivity – Minimizes signal interference, improving data accuracy in electrical imaging.
- Highly Durable & Wear-Resistant – Provides long-lasting performance for extended scanning sessions.
- Compatible with Major AFM Systems – Works seamlessly with Bruker, Asylum Research, Oxford Instruments, and other leading AFM brands.
- Ideal for Semiconductor & Materials Science Research – Perfect for nanomechanical characterization, nanoelectronics, and AFM-based surface analysis.
- Precision Nanotechnology Surface Analysis Tools – Supports electrical property mapping in advanced research applications.
| Specification | Details |
|---|---|
| Product Name | SPARK 70 Conductive AFM Probe |
| Tip Coating | Platinum (Pt) |
| Tip Radius | <25 nm |
| Cantilever Material | Silicon |
| Resonant Frequency | ~70 kHz |
| Force Constant | ~2.5 N/m |
| Compatibility | Bruker, Asylum Research, Oxford Instruments, and other AFM systems |
| Application | C-AFM, Electrical Conductivity Mapping, Semiconductor Research |
| Industry Use | Nanotechnology, Materials Science, Semiconductor Research |
- AFM for Materials Research – Provides high-resolution imaging for nanoscale characterization.
- Conductive AFM for Semiconductors – Enables dopant profiling and electrical conductivity analysis.
- Electrical Property Mapping with AFM – Ideal for thin-film characterization and nanoelectronics.
- Nanotechnology Surface Analysis Tools – Supports advanced surface engineering and nanomaterial studies.
- Bruker AFM Probes Alternative – Offers high-performance AFM scanning comparable to leading brands.
- Comparison: Silicon Nitride vs. Platinum AFM Probes – Platinum-coated tips provide higher conductivity and durability.
- Carbon Nanotube AFM Tips Alternative – Offers superior conductivity and wear resistance for extended use.
- Advanced Conductive Microscopy Tool for Semiconductor Research – Enables high-sensitivity electrical imaging.
- Scientifically Designed for High-Resolution Electrical Imaging – Delivers unmatched accuracy for conductivity mapping.
- Platinum-Coated AFM Tip for Maximum Conductivity – Ensures stable and precise electrical measurements.
- Optimized for Multiple AFM Techniques – Fully compatible with C-AFM, EFM, and SPM applications.
- Highly Durable & Wear-Resistant AFM Probe – Minimizes tip degradation for extended scanning performance.
- Trusted by Leading Research Institutions & Semiconductor Manufacturers – Used in advanced research labs.
- Ideal for Semiconductor & Nanotechnology Research – Ensures reliable electrical property mapping.
- Low-Noise AFM Probe for High-Sensitivity Imaging – Reduces background noise for enhanced signal clarity.
- Compatible with Major AFM Systems & Researchers Worldwide – Seamlessly integrates with leading AFM platforms.
