Pin Mount SEM Specimen Holders are essential electron microscopy consumables designed for secure and precise sample mounting in Scanning Electron Microscopy (SEM). These holders ensure optimal conductivity, minimal movement, and easy sample handling, improving the accuracy and efficiency of SEM sample preparation.
Available in multiple configurations, including:
- Standard SEM Pin Stubs – For single sample mounting.
- Multi-Pin Stub Holders – Enables batch processing of multiple specimens.
- Variable Tilt Holders – Adjustable angles for detailed surface topography analysis.
- SEM Pin Mount Adapters – Universal compatibility with leading electron microscopy systems.
- High-Precision Sample Holding – Ensures stable mounting with minimal movement for high-resolution imaging.
- Durable & Corrosion-Resistant Material – Made from premium aluminum or stainless steel for long-lasting use.
- Optimized for Electron Microscopy Applications – Enhances SEM imaging by reducing charging effects.
- Universal Compatibility – Fits JEOL, Hitachi, Zeiss, Tescan, and other major SEM brands.
- Wide Variety of Sizes & Configurations – Choose from standard, multi-pin, or variable tilt options.
- Smooth Sample Preparation Process – Simple mounting and easy removal for efficient workflows.
- Multi-Sample Holders for Increased Productivity – Mount several specimens simultaneously to optimize lab work.
- Protective Storage Available – SEM specimen storage boxes help protect samples from contamination.
- Adjustable Tilt Holders for Advanced Imaging – Allows precise angle adjustment for improved 3D surface analysis.
- High Electrical Conductivity – Reduces artifacts and interference, ensuring clear electron microscopy images.
| Specification | Details |
|---|---|
| Product Type | Pin Mount SEM Specimen Holders |
| Material | Aluminum / Stainless Steel |
| Holder Configurations | Standard Pin Stubs, Multi-Pin Holders, Variable Tilt Holders |
| Pin Size | 3.2 mm (Standard SEM Pin Stub Size) |
| Compatibility | JEOL, Hitachi, Zeiss, Tescan, and other major SEM brands |
| Specimen Capacity | Single & Multi-Sample Holders Available |
| Adjustment Features | Fixed & Adjustable Tilt Options |
| Application | SEM Imaging, Sample Preparation, Forensics, Industrial QC |
- Scanning Electron Microscopy (SEM) Imaging – Ensures stable specimen mounting for high-resolution imaging.
- SEM Sample Preparation – Provides a secure platform for precise positioning of specimens.
- Material Science & Nanotechnology – Used for studying metals, polymers, semiconductors, and biological specimens.
- Surface Topography Analysis – Essential for SEM imaging of microstructures and nanomaterials.
- Failure Analysis & Forensic Investigation – Provides stable positioning for forensic SEM investigations.
- Industrial Quality Control (QC) – Used in semiconductor, aerospace, and pharmaceutical industries.
- Multi-Sample Analysis – Multi-pin stub holders allow multiple samples to be analyzed in one session.
- High-Quality Manufacturing – Made from durable, non-magnetic materials for long-term performance.
- Designed for High-Resolution SEM Imaging – Optimized for detailed electron microscopy analysis.
- Available in Multiple Configurations – Choose from standard, multi-specimen, and adjustable tilt holders.
- Wide Compatibility with SEM Systems – Compatible with leading electron microscopy brands.
- Trusted by Leading Research Institutions – Used in universities, laboratories, and industrial applications.
- Fast Shipping & Global Availability – Ready for immediate worldwide delivery.
