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Nunano AFM Probes

Nunano AFM Probes

NuNano AFM Probes | Scout Silicon & Spark Conductive | Global Bio Science Solution

NuNano AFM Probes Collection

Expertly crafted silicon and conductive scanning probe microscopy tips. From ultra-soft biological imaging to high-aspect-ratio deep trench analysis and high-frequency electrical characterization, the SCOUT and SPARK series provide unmatched consistency and high-resolution topography.

Scout 70 Series AFM Probes (Ultra-Soft)

Scout 70 Silicon AFM Probe for Soft Tapping

Scout 70 Silicon AFM Probe

70 kHz Frequency 2 N/m Spring Const Soft Tapping

The ideal probe for imaging delicate biological samples and soft polymers in air without deforming the surface.

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Scout 70 High Aspect Ratio Silicon AFM Probe

Scout 70 HAR AFM Probe

High Aspect Ratio Conical Tip Low Force Imaging

Combines the gentle touch of the Scout 70 cantilever with a high aspect ratio tip for precise profiling of deep features.

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Scout 150 Series AFM Probes

Scout 150 Silicon AFM Probe for Tapping Mode

Scout 150 Silicon AFM Probe

150 kHz Frequency 18 N/m Spring Const Tapping Mode

The versatile choice for routine imaging. Provides a balanced resonant frequency for high-quality topography in air.

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Scout 150 HAR Silicon AFM Probe for Deep Trenches

Scout 150 HAR AFM Probe

High Aspect Ratio Narrow Trench Advanced Precision

Engineered for profiling deep and narrow surface features where standard tips cannot reach, ensuring superior lateral resolution.

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Scout 350 Series AFM Probe (High-Speed)

Scout 350 High Speed Silicon AFM Probe

Scout 350 Silicon AFM Probe

350 kHz Frequency 42 N/m Spring Const Tapping Mode

The standard for high-speed tapping mode. Features a highly consistent cantilever and sharp tip for routine high-resolution mapping.

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Scout 350 High Aspect Ratio Silicon AFM Probe

Scout 350 HAR AFM Probe

High Aspect Ratio Silicon Tip Deep Trench Imaging

Specially engineered with a high aspect ratio tip for precise imaging of deep trenches and steep sidewalls in semiconductor analysis.

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Spark Series Conductive AFM Probe

Spark 70 Pt Platinum Coated Conductive AFM Probe

Spark 70 Pt Conductive AFM Probe

Platinum Coated 70 kHz Frequency Soft Samples

Ideal for electrical measurements on delicate or soft conductive samples requiring low force and soft tapping.

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Spark 150 Pt Conductive AFM Probe for Electrical Mapping

Spark 150 Pt Conductive AFM Probe

Conductive Tip 150 kHz Frequency Mid-Stiffness

A versatile probe that balances resonant frequency for high-quality electrical and mechanical mapping.

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Spark 350 Pt Conductive AFM Probe for KPFM and EFM

Spark 350 Pt Conductive AFM Probe

Pt/Ir Coating 350 kHz Frequency High-Speed Electrical

Designed for high-frequency electrical modes. Offers peak sensitivity for EFM and KPFM characterization.

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