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SCOUT 350 AFM Probe

SCOUT 350 AFM Probe

NuNano Scout 350 AFM Probes | Scout 350 Series

NuNano Scout 350 AFM Probes

High-performance silicon AFM probes designed for tapping mode and non-contact mode applications. Engineered for precision, reliability, and superior imaging quality.

Scout 350 HAR Silicon AFM Probe

Scout 350 HAR

High Aspect Ratio Silicon Tip Deep Trench Imaging

Specially engineered with a high aspect ratio tip for precise imaging of deep trenches and steep sidewalls in semiconductor and nanostructure analysis.

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Scout 350 Silicon AFM Probe

Scout 350 Silicon

350 kHz Resonant Freq 42 N/m Spring Const Tapping Mode

The standard for high-speed tapping mode. Features a highly consistent cantilever and sharp tip for routine high-resolution surface mapping.

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