The SCOUT 150 AFM Probe is a high-quality silicon AFM probe, engineered for AC mode AFM imaging, non-contact mode, and soft tapping mode applications. Designed with tight dimensional tolerances, this NuNano AFM probe ensures high-resolution, consistent imaging across nanostructures, materials, and biological samples.
This probe features a sharp silicon tip with a high aspect ratio (HAR) option, making it ideal for deep trench imaging and complex surface topology scans. Whether you’re conducting advanced nanomechanical research or surface characterization, the SCOUT 150 AFM probe delivers precision, reliability, and durability.
Available in Scout 150 RAl and other coating options, this probe ensures optimal performance for various AFM applications, making it a preferred choice among scientists, researchers, and semiconductor professionals.
High-Resolution AFM Imaging for Nanoscale Analysis
- Optimized for AC Mode AFM & Non-Contact Mode – Reduces sample damage while ensuring sharp, high-quality imaging.
- High Aspect Ratio AFM Probe (HAR) – Less than 15° cone angle over the final 1 μm, perfect for deep trench imaging and 3D nanoscale surface mapping.
- Sharp Silicon Tip – Ensures precise and repeatable scanning, ideal for AFM probe comparison in advanced studies.
- Scout 150 RAl Option Available – A specialized reflective aluminum-coated AFM probe for enhanced laser signal detection.
Versatile Coating & Probe Options
- Uncoated Version – Provides general-purpose AFM imaging with high sensitivity.
- Aluminum-Coated (Scout 150 RAl) – Improves laser reflection, optimizing AFM performance in demanding applications.
- Gold-Coated Version – Suitable for conductive AFM measurements and electrical property analysis.
Consistent & Reliable AFM Performance
- Manufactured with Tight Dimensional Tolerances – Ensures low variation in AFM probe specifications for reliable research results.
- Designed for High-Resolution AFM Imaging – Works seamlessly in soft tapping mode AFM, AC mode AFM, and force modulation techniques.
- Compatible with Leading AFM Systems – Used by researchers, universities, and industry experts worldwide.
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| Parameter | Specification |
|---|---|
| Spring Constant | 40 N/m |
| Resonant Frequency | 350 kHz |
| Tip Radius | Nominal 5 nm |
| Tip Height | Approx. 12 μm |
| Cantilever Length | 125 μm |
| Cantilever Width | 30 μm |
| Cantilever Thickness | 2.5 μm |
| Coating Options | Uncoated, Aluminum, Gold, Conductive Coating |
| Mode of Operation | Contact Mode, Tapping Mode, Magnetic Force Microscopy (MFM), Conductive AFM |
| Application Areas | Surface Topography Measurement, Nanomaterials Characterization, Semiconductor Research, AFM Imaging Techniques |
The SCOUT 150 AFM Probe is designed for high-resolution AFM imaging across multiple research fields, including:
🔹 Biological AFM Imaging – Scan soft biological samples with minimal force interference.
🔹 Nano Imaging & Material Science – Ideal for thin film characterization, polymer analysis, and surface roughness studies.
🔹 Semiconductor Research – Enables high-resolution defect detection in microelectronics.
🔹 AFM Probe Comparison Studies – Perfect for testing different AFM probe types and coatings.
- Trusted by Researchers & Industry Experts: Widely used by scientists, universities, and semiconductor researchers, the SCOUT 150 AFM Probe is a highly precise AFM probe trusted for advanced nano imaging applications.
- Optimized for AC Mode & Soft Tapping AFM: With a high resonant frequency of 150 kHz, this probe provides exceptional imaging stability, ensuring accurate nanoscale measurements.
- Multiple Coating & Tip Options Available: The Scout 150 RAl version features an aluminum coating for enhanced reflectivity, while other options cater to electrical and biological applications.
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