The Scout 70 AFM Probe by NuNano is a premium silicon AFM probe designed for high-resolution nano imaging in non-contact and soft tapping AFM modes. Engineered with strict dimensional tolerances, it delivers consistent, reproducible imaging with exceptional tip sharpness and sensitivity.
This atomic force microscopy (AFM) probe is perfect for biological research, material science, semiconductor analysis, and nanotechnology applications, ensuring minimal sample interaction while maintaining high-precision imaging. Available in uncoated, aluminum-coated, and gold-coated options, the Scout 70 AFM Probe caters to various AFM applications, offering enhanced performance based on research needs.
With its high aspect ratio (HAR) tip option, the Scout 70 AFM Probe is also optimized for deep trench imaging, making it an excellent choice for force modulation AFM, thin film analysis, and nanoscale mechanical property measurements.
Superior Imaging & High-Resolution Performance
- Optimized for Non-Contact & Soft Tapping AFM – Ensures minimal tip-sample interaction for sensitive sample analysis.
- High Aspect Ratio Tip (HAR) – Less than 15° cone angle over the final 1 μm, ideal for deep trench imaging and high-precision scanning.
- Advanced Tip Design – Features a nominal tip radius of 5 nm, ensuring sharp, detailed imaging at the nanoscale level.
- Optimized Spring Constant & Resonant Frequency – Provides high stability and accuracy across different AFM applications.
Versatile Coating Options for Enhanced Performance
- Uncoated Version – Ideal for general-purpose AFM applications where additional reflectivity is not required.
- Aluminum-Coated (Al) – Enhances laser reflection efficiency, improving AFM probe signal quality.
- Gold-Coated (Au) – Best for conductive AFM measurements and enhanced optical detection.
Consistent & Reliable AFM Performance
- Manufactured with Tight Dimensional Tolerances – Minimizes variations in spring constant and resonance frequency, ensuring consistent results across all AFM scans.
- Designed for AC Mode AFM & Force Modulation AFM – Suitable for quantitative nanomechanical property measurements.
- Compatible with Leading AFM Systems – Works seamlessly with a wide range of AFM instruments from top AFM probe suppliers.
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| Parameter | Specification |
|---|---|
| Spring Constant | 2 N/m |
| Resonant Frequency | 70 kHz |
| Tip Radius | Nominal 5 nm |
| Tip Height | Approx. 12 μm |
| Cantilever Length | 225 μm |
| Cantilever Width | 30 μm |
| Cantilever Thickness | 2.5 μm |
| Coating Options | Uncoated, Aluminum, Gold |
| Mode of Operation | Non-Contact, Soft Tapping, Force Modulation |
| Application Areas | High-Resolution AFM Imaging, Nano Imaging, Semiconductor Analysis, Biological Research |
The Scout 70 AFM Probe is designed for a wide range of AFM imaging applications, making it an indispensable tool for nanotechnology and research laboratories.
🔹 Biological AFM Imaging – Ideal for live-cell imaging, protein structures, and soft biomaterials.
🔹 Material Science & Nanostructure Analysis – Enables high-resolution scanning of thin films, nanomaterials, and polymer surfaces.
🔹 Deep Trench & High-Aspect Ratio Imaging – HAR tip design ensures precise AFM scanning of deep structures.
🔹 Force Modulation & Mechanical Property Analysis – Used in quantitative nanomechanical measurements and nanoscale adhesion force studies.
🔹 Semiconductor Research & Thin Film Studies – Ensures precise AFM cantilever probe scanning for microelectronics applications.
1. Trusted by Scientists & Researchers Worldwide
The Scout 70 AFM Probe is widely used by research institutions, universities, and semiconductor industries for its high sensitivity and durability. Its sharp tip, precision coating, and stable resonance frequency make it a go-to AFM probe for high-resolution nano imaging and material characterization.
2. Enhanced Sensitivity for Soft Sample Imaging
Its optimized spring constant and tip sharpness allow researchers to scan soft biological samples without damaging delicate structures. It is perfect for force modulation AFM, where maintaining accurate nanoscale force measurements is critical.
3. Cost-Effective & High-Quality AFM Probes
NuNano ensures each batch of Scout 70 AFM Probes is manufactured with tight quality control to provide researchers with reliable and reproducible results. The pack of 10 probes offers great value for laboratories and industry professionals.
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