The SPARK 150 Pt Conductive AFM Probe is a precision-engineered Atomic Force Microscopy (AFM) probe designed for nanoscale electrical characterization and high-resolution conductivity mapping. Featuring a platinum-coated AFM tip, this probe ensures low-noise, wear-resistant, and high-durability performance for applications like semiconductor conductivity measurement, dielectric material testing, and nanoelectronics research.
With high mechanical stability and excellent electrical conductivity, the SPARK 150 Pt probe is ideal for Conductive Atomic Force Microscopy (C-AFM), Electrostatic Force Microscopy (EFM), and semiconductor dopant profiling.
This compact and durable laboratory instrument is widely used in TLC (Thin Layer Chromatography), forensic analysis, and environmental testing. Its MS-coated material with soft glass LED tubes ensures long-lasting performance and efficient UV exposure.
- Platinum-Coated AFM Tip for Superior Conductivity – Ensures low contact resistance, making it ideal for current sensing and electrical characterization.
- Optimized for Conductive AFM (C-AFM) & Electrical AFM Imaging – Provides precise nanoscale electrical mapping for semiconductors, thin films, and nanomaterials.
- High-Resolution AFM Imaging for Advanced Research – Offers exceptional tip sharpness for accurate conductivity and surface charge measurements.
- Durable & Wear-Resistant for Extended Scanning – Built with long-lasting platinum coating to reduce tip degradation.
- Low-Noise AFM Probe for Nanoscale Imaging – Ensures high signal fidelity for sensitive electronic and material analysis.
- Compatible with Major AFM Systems – Works with Bruker, Oxford Instruments, Asylum Research, and other leading AFM brands.
- Ideal for Semiconductor Conductivity Measurement & Nanoelectronics – Perfect for dopant profiling, dielectric material testing, and graphene-coated sample analysis.
- Excellent for Material Science & Surface Analysis – Used in solar cell research, thin-film conductivity mapping, and polymeric material testing.
| Specification | Details |
|---|---|
| Product Name | SPARK 150 Pt Conductive AFM Probe |
| Tip Coating | Platinum (Pt) |
| Tip Radius | <30 nm |
| Cantilever Material | Silicon |
| Resonant Frequency | ~150 kHz |
| Force Constant | ~5 N/m |
| Compatibility | Bruker, Asylum Research, Oxford Instruments, and other AFM systems |
| Application | C-AFM, EFM, SCM, Conductivity Mapping, Semiconductor Research |
| Industry Use | Semiconductor, Nanotechnology, Material Science, Solar Cells |
- Semiconductor Conductivity Measurement – Enables dopant profiling, dielectric material analysis, and thin-film testing.
- Nanoscale Electrical Characterization – Used for measuring electrical transport properties at the atomic level.
- Dielectric Material Testing with AFM – Ideal for characterizing insulating materials in nanoelectronics.
- Nanotechnology & AFM Research – Supports material science investigations, polymer conductivity studies, and graphene surface analysis.
- Nanoelectronics Conductivity Mapping – Provides high-resolution imaging of conductive and semi-conductive materials.
- Solar Cell Material Testing with C-AFM – Ensures reliable characterization of photovoltaic materials and organic electronics.
- Scientifically Designed for High-Resolution Electrical Imaging – Ideal for semiconductors, nanomaterials, and AFM-based electrical measurements.
- Platinum-Coated AFM Tip for Maximum Conductivity – Reduces contact resistance and enhances signal clarity.
- Optimized for Multiple AFM Techniques – Fully compatible with C-AFM, EFM, SCM, and SPM applications.
- Highly Durable & Wear-Resistant AFM Probe – Ensures long scanning lifetimes with minimal degradation.
- Trusted by Leading Research Institutions & Semiconductor Manufacturers – Used in advanced material analysis labs.
- Ideal for Semiconductor & Nanotechnology Research – Supports precise nanoscale electrical characterization.
- Low-Noise AFM Probe for High-Sensitivity Imaging – Delivers accurate current mapping with minimal interference.
- Compatible with Major AFM Systems & Researchers Worldwide – Ensures seamless integration into existing AFM setups.
