Scout 70 AFM Probe
The Scout 70 AFM Probe by NuNano is a premium silicon AFM probe designed for high-resolution nano imaging in non-contact and soft tapping AFM modes. Engineered with strict dimensional tolerances, it delivers consistent, reproducible imaging with exceptional tip sharpness and sensitivity.
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SCOUT 150 AFM Probe
The SCOUT 150 AFM Probe is a high-quality silicon AFM probe, engineered for AC mode AFM imaging, non-contact mode, and soft tapping mode applications. Designed with tight dimensional tolerances, this NuNano AFM probe ensures high-resolution, consistent imaging across nanostructures, materials, and biological samples.
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SCOUT 350 AFM Probe
SCOUT 350 AFM Probe is a high-performance atomic force microscopy (AFM) probe, engineered for tapping mode AFM, contact mode AFM, and advanced scanning probe microscopy (SPM) techniques. Designed for high-resolution AFM imaging, this probe provides exceptional accuracy in surface characterization, nanomaterials analysis, and force spectroscopy measurements.
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Spark 70 AFM Probe
PARK 70 Conductive AFM Probe is a high-performance Atomic Force Microscopy (AFM) tip, designed for nanomechanical characterization and electrical property mapping.
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Spark 150 AFM Probe
SPARK 150 Pt Conductive AFM Probe is a precision-engineered Atomic Force Microscopy (AFM) probe designed for nanoscale electrical characterization and high-resolution conductivity mapping.
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Spark 350 AFM Probe
SPARK 350 PT Conductive AFM Probe is a high-precision Atomic Force Microscope probe designed for advanced electrical measurements and conductivity mapping with a platinum-coated AFM tip.
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