The SPARK 350 PT Conductive AFM Probe is a high-precision Atomic Force Microscope probe designed for advanced electrical measurements and conductivity mapping. With a platinum-coated AFM tip, this probe offers high conductivity, durability, and exceptional imaging resolution, making it an ideal choice for current sensing, electrical characterization, and material science applications.
Engineered for scanning probe microscopy (SPM), the SPARK 350 PT probe ensures stable, low-noise electrical measurements while maintaining sharp tip integrity. It is widely used in semiconductor research, nanotechnology, and surface analysis.
This compact and durable laboratory instrument is widely used in TLC (Thin Layer Chromatography), forensic analysis, and environmental testing. Its MS-coated material with soft glass LED tubes ensures long-lasting performance and efficient UV exposure.
- Platinum-Coated AFM Tip for High Conductivity – The SPARK 350 PT is coated with high-purity platinum, ensuring low-contact resistance and reliable conductivity for current-sensing applications.
- Optimized for Conductive AFM (C-AFM) & EFM – Works seamlessly in Conductive Atomic Force Microscopy (C-AFM), Electrostatic Force Microscopy (EFM), and Scanning Capacitance Microscopy (SCM).
- Ultra-Sharp AFM Tip for High-Resolution Imaging – Provides precise nanoscale mapping, making it ideal for material characterization and electrical property analysis.
- Robust and Durable Design – Built for long-lasting performance in repeated scanning cycles, reducing tip degradation.
- Low Contact Resistance for Accurate Electrical Measurements – Ensures high signal integrity and reduces data noise during conductivity testing.
- NuNano SPARK 350 PT Cantilever – Offers exceptional mechanical stability, making it compatible with various AFM techniques.
- Compatible with Leading AFM Systems – Can be used with industry-standard Atomic Force Microscopes, including those used in semiconductor, materials science, and industrial research.
- Ideal for Scanning Probe Microscopy (SPM) Research – Supports advanced surface analysis techniques for electronics, polymers, and nanomaterials characterization.
- Precision Fabrication for Reliable Performance – Designed with tight dimensional tolerances, ensuring consistent measurement accuracy.
- High Sensitivity for Electrical Imaging – Delivers detailed surface conductivity mapping for scientific and industrial applications.
| Specification | Details |
|---|---|
| Product Name | SPARK 350 PT Conductive AFM Probe |
| Tip Coating | 40 nm Platinum (Pt) with 5 nm Titanium (Ti) adhesion layer on both sides |
| Tip Radius | <30 nm |
| Tip Height | 6 µm (Range: 5–8 µm) |
| Tip Setback | 7.5 µm (Range: 6.5–8.5 µm) |
| Tip Cone Angle | 25° (Range: 15°–40°) |
| Tip Material Resistivity | 0.02 Ω·cm (Range: 0.015–0.025 Ω·cm) |
| Cantilever Shape | Rectangular |
| Cantilever Length | 125 µm (Range: 123–127 µm) |
| Cantilever Width | 30 µm (Range: 28–32 µm) |
| Cantilever Thickness | 4.5 µm (Range: 4.0–5.0 µm) |
| Spring Constant | 42 N/m (Range: 25–70 N/m) |
| Resonant Frequency | 350 kHz (Range: 300–400 kHz) |
| Cantilever Material | Silicon (n-type, Antimony-doped) |
| Chip Dimensions (L × W × T) | 3.4 mm × 1.6 mm × 0.3 mm |
| Cantilever Anchor | Yes |
| Alignment Grooves | No |
| Applications | Conductive AFM (C-AFM), Electrostatic Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), Piezoresponse Force Microscopy (PFM) |
- Conductive AFM (C-AFM) for Electrical Conductivity Measurements – Used in semiconductor characterization, graphene studies, and resistivity mapping.
- Scanning Probe Microscopy (SPM) Research – Ideal for nanomaterials, thin-film coatings, and surface charge analysis.
- Material Science & Surface Characterization – Enables high-resolution conductivity imaging for polymeric and electronic materials.
- Electrostatic Force Microscopy (EFM) for Charge Distribution Mapping – Helps in analyzing charge storage and surface potential.
- Current Sensing AFM for Semiconductor Research – Measures nanoscale electrical transport properties in semiconductors and conductive nanostructures.
- Scanning Capacitance Microscopy (SCM) for Dielectric Analysis – Used for measuring dopant profiles and dielectric properties.
- High-Resolution Imaging in Nanotechnology – Ensures precise characterization of electrical and mechanical properties at the atomic level.
- Quality Control in Industrial Research – Provides detailed surface analysis for electronic and material development.
- Scientifically Designed for High-Resolution Electrical Measurements – Ensures accurate and reliable data.
- Platinum-Coated AFM Tip for Maximum Conductivity – Offers low resistance and high signal fidelity.
- Optimized for Multiple AFM Techniques – Compatible with C-AFM, EFM, SCM, and SPM applications.
- Trusted by Leading Researchers and Universities – Used in advanced material science and nanotechnology labs.
- Durable & Long-Lasting AFM Probe – Designed for extended scanning with minimal tip degradation.
- Compatible with Major AFM Systems – Works with Bruker, Oxford Instruments, Asylum Research, and other AFM brands.
- Enhances AFM Electrical Imaging Capabilities – Improves sensitivity and resolution in conductivity and charge mapping.
- Ideal for Semiconductor & Nanotechnology Applications – Ensures precise measurement of conductive materials.
